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Room-temperature oxygen sensitization in highly textured, nanocrystalline PbTe films: A mechanistic study

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dc.contributor MIT Materials Research Laboratory
dc.contributor Massachusetts Institute of Technology. Department of Materials Science and Engineering
dc.contributor Massachusetts Institute of Technology. Microphotonics Center
dc.contributor Wang, Jianfei
dc.contributor Hu, Juejun
dc.contributor Becla, Piotr
dc.contributor Agarwal, Anuradha Murthy
dc.contributor Kimerling, Lionel C.
dc.creator Wang, Jianfei
dc.creator Hu, Juejun
dc.creator Becla, Piotr
dc.creator Kimerling, Lionel C.
dc.creator Agarwal, Anuradha Murthy
dc.date 2013-07-30T18:34:43Z
dc.date 2013-07-30T18:34:43Z
dc.date 2011-10
dc.date 2011-05
dc.date.accessioned 2023-03-01T18:04:35Z
dc.date.available 2023-03-01T18:04:35Z
dc.identifier 00218979
dc.identifier 1089-7550
dc.identifier http://hdl.handle.net/1721.1/79729
dc.identifier Wang, Jianfei, Juejun Hu, Piotr Becla, Anuradha M. Agarwal, and Lionel C. Kimerling. “Room-temperature oxygen sensitization in highly textured, nanocrystalline PbTe films: A mechanistic study.” Journal of Applied Physics 110, no. 8 (2011): 083719. © 2011 American Institute of Physics
dc.identifier https://orcid.org/0000-0002-7233-3918
dc.identifier https://orcid.org/0000-0002-0769-0652
dc.identifier https://orcid.org/0000-0002-3913-6189
dc.identifier.uri http://localhost:8080/xmlui/handle/CUHPOERS/278652
dc.description In this paper, we report large mid-wave infrared photoconductivity in highly textured, nanocrystalline PbTe films thermally evaporated on Si at room temperature. Responsivity as high as 25 V/W is measured at the 3.5 μm wavelength. The large photoconductivity is attributed to the oxygen incorporation in the films by diffusion. Carrier concentration as low as 10[superscript 17] cm[superscript −3] is identified to be the consequence of Fermi level pinning induced by the diffused oxygen. The successful demonstration of IR-sensitive PbTe films without the need for high-temperature processing presents an important step toward monolithic integration of mid-wave PbTe infrared detectors on Si read-out integrated circuits (ROICs).
dc.format application/pdf
dc.language en_US
dc.publisher American Institute of Physics (AIP)
dc.relation http://dx.doi.org/10.1063/1.3653832
dc.relation Journal of Applied Physics
dc.rights Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
dc.source MIT web domain
dc.title Room-temperature oxygen sensitization in highly textured, nanocrystalline PbTe films: A mechanistic study
dc.type Article
dc.type http://purl.org/eprint/type/JournalArticle


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