| dc.contributor |
Materials Engineering Science |
|
| dc.creator |
Li, Chen-Chung |
|
| dc.date |
2014-03-14T21:21:50Z |
|
| dc.date |
2014-03-14T21:21:50Z |
|
| dc.date |
1994-01-15 |
|
| dc.date |
2005-10-20 |
|
| dc.date |
2005-10-20 |
|
| dc.date |
2005-10-20 |
|
| dc.date.accessioned |
2023-02-28T16:56:44Z |
|
| dc.date.available |
2023-02-28T16:56:44Z |
|
| dc.identifier |
etd-10202005-102831 |
|
| dc.identifier |
http://hdl.handle.net/10919/40039 |
|
| dc.identifier |
http://scholar.lib.vt.edu/theses/available/etd-10202005-102831/ |
|
| dc.identifier.uri |
http://localhost:8080/xmlui/handle/CUHPOERS/264457 |
|
| dc.description |
A novel in-situ stress measurement technique to study the formation kinetics of multi component oxide thin films was developed and was applied to PbTiO₃. Single phase PbTi 0₃ thin films were formed from the reaction between films in the deposited PbO ITi0₂ multilayer. The film stoichiometry was accurately controlled by depositing individual layers of the required thickness. Development of film stresses associated with the formation of the product layer at the PbO/Ti0₂ interface of the multilayers was used to monitor growth rate of the PbTiO₃ layer. It was found that growth of the PbTiO₃ phase obeyed the parabolic law and the effective activation energy was estimated to be 108 kJ/mole. It is believed that the mechanism of this reaction was dominated by grain boundary diffusion of the participating cations. |
|
| dc.description |
Ph. D. |
|
| dc.format |
xii, 124 leaves |
|
| dc.format |
BTD |
|
| dc.format |
application/pdf |
|
| dc.format |
application/pdf |
|
| dc.language |
en |
|
| dc.publisher |
Virginia Tech |
|
| dc.relation |
OCLC# 30888329 |
|
| dc.relation |
LD5655.V856_1994.L5.pdf |
|
| dc.rights |
In Copyright |
|
| dc.rights |
http://rightsstatements.org/vocab/InC/1.0/ |
|
| dc.subject |
LD5655.V856 1994.L5 |
|
| dc.subject |
Thin films |
|
| dc.title |
Ion assisted deposition of multicomponent thin films |
|
| dc.type |
Dissertation |
|
| dc.type |
Text |
|